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SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Optical phonons in layer PbI2 crystals with stacking faults by Davydova, N. A.; Bibik, V. A.; Svechnikov, Sergey V.; Valakh, Mikhail Y. is a scholarly article available to read on EtoBox.

Author
Davydova, N. A.; Bibik, V. A.; Svechnikov, Sergey V.; Valakh, Mikhail Y.
Publisher
SPIE
Published
1995
Language
EN

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