About this scholarly article

SPIE Proceedings [SPIE Optoelectronics '99 - Integrated Optoelectronic Devices - San Jose, CA (Saturday 23 January 1999)] Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV - Phase change induced in laser diode interferometric system for measurements with optical fiber in composite material by Garcia Souto, Jose A.; Lamela, Horacio; Fallahi, Mahmoud; Linden, Kurt J.; Wang, S. C. is a scholarly article available to read on EtoBox.

Author

Garcia Souto, Jose A.; Lamela, Horacio; Fallahi, Mahmoud; Linden, Kurt J.; Wang, S. C.

Publisher

SPIE

Published

1999

Language

EN