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In-Situ Electron Microscopy (Applications in Physics, Chemistry and Materials Science) by Dehm, Gerhard; Howe, James M.; Zweck, Josef is a scholarly article available to read on EtoBox.

What is In-Situ Electron Microscopy (Applications in Physics, Chemistry and Materials Science) about?

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed

Author

Dehm, Gerhard; Howe, James M.; Zweck, Josef

Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Published

2012

Language

EN

ISBN

9783527652174