About this document
Jlpea 01 00357 by ndmthi is a document available to read on EtoBox.
The paper discusses the importance of minimizing power consumption in semiconductor designs during both functional operation and manufacturing tests, highlighting the role of commercial design-for-test (DFT) tools in achieving this goal. It outlines various low power management techniques and emphasizes the need for power-aware DFT methodologies to ensure effective testing of low power designs while maintaining test quality and minimizing costs. The document also provides an overview of power-aware testing
- Author
- ndmthi
- Language
- EN