About this scholarly article

SPIE Proceedings [SPIE Optical Systems Design and Production - Berlin, Germany (Wednesday 26 May 1999)] Advances in Optical Interference Coatings - Coating requirements for the reference flat of a Fizeau interferometer used for measuring from uncoated to highly reflecting surfaces by Netterfield, Roger P.; Drage, David J.; Freund, Christopher H.; Walsh, Christopher J.; Leistner, Achim J.; Seckold, Jeffrey A.; Oreb, Bozenko F.; Amra, Claude; Macleod, H. Angus is a scholarly article available to read on EtoBox.

Author

Netterfield, Roger P.; Drage, David J.; Freund, Christopher H.; Walsh, Christopher J.; Leistner, Achim J.; Seckold, Jeffrey A.; Oreb, Bozenko F.; Amra, Claude; Macleod, H. Angus

Publisher

SPIE

Published

1999