About this scholarly article

SPIE Proceedings [SPIE San Diego, '91, San Diego, CA - San Diego, CA (Sunday 21 July 1991)] Multilayer Optics for Advanced X-Ray Applications - Upgraded facility for multilayer mirror characterization at NIST by Watts, Richard N.; Ederer, David L.; Deslattes, Jr., Richard D.; Lucatorto, Thomas B.; Estler, William T.; Evans, Christopher J.; Vorburger, Theodore V.; Ceglio, Natale M. is a scholarly article available to read on EtoBox.

Author

Watts, Richard N.; Ederer, David L.; Deslattes, Jr., Richard D.; Lucatorto, Thomas B.; Estler, William T.; Evans, Christopher J.; Vorburger, Theodore V.; Ceglio, Natale M.

Publisher

SPIE

Published

1992

Language

EN