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Single crystal epitaxial deposits of copper have been electrodeposited on (100) oriented single-crystal copper substrates using both direct current and asymmetric periodic reverse current methods. It was found that the degree of crystalline perfection is approximately the same for both methods and reflects the substrate perfection. The epitaxial growth and perfection of the deposits are not appreciably affected by dissolved lead impurities in the electrolyte over the range 0.25 to 100 parts per million of lead. The reverse current deposits have a considerably larger crystallite size which is attributed to a lower effective rate of nucleation. (Author)

Author

O'Connor, John J.

Publisher

Air Force Cambridge Research Laboratories, Office of Aerospace Research, United States Air Force, 1966.

Published

1966

Language

EN