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About this Engineering article
Depth-Profiling of Phase Composition and Texture in Layered-Graded Al2O3- & Ti3SiC2-Based Systems Using X-Ray and Synchrotron Radiation Diffraction by Low, I.M.; Singh, M.; Manurung, P.; Wren, E.; Sheppard, D.P.; Barsoum, M.W. is a Engineering article available to read on EtoBox.
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- Author
- Low, I.M.; Singh, M.; Manurung, P.; Wren, E.; Sheppard, D.P.; Barsoum, M.W.
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9795)
- Published
- 2002
- Field
- Engineering (Physical Sciences)
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