About this scholarly article

2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - Negative bias temperature instability of pMOSFETs with ultra-thin SiON gate dielectrics by Tsujikawa, S.; Mine, T.; Watanabe, K.; Shimamoto, Y.; Tsuchiya, R.; Ohnishi, K.; Onai, T.; Yugami, J.; Kimura, S. is a scholarly article available to read on EtoBox.

Author

Tsujikawa, S.; Mine, T.; Watanabe, K.; Shimamoto, Y.; Tsuchiya, R.; Ohnishi, K.; Onai, T.; Yugami, J.; Kimura, S.

Publisher

IEEE

Published

2003