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About this Engineering article
Accurate modeling of the source resistance in modulation-doped FETs by Fu, S.-T.; Das, M.B. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Fu, S.-T.; Das, M.B.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 1992
- Language
- EN
- Field
- Engineering (Physical Sciences)