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About this Engineering article
Digital image correlation-based analysis of strain accumulation on a duplex γ-TiAl by Patriarca, L.; Filippini, M.; Beretta, S. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Patriarca, L.; Filippini, M.; Beretta, S.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0966-9795)
- Published
- 2016
- Language
- EN
- Field
- Engineering (Physical Sciences)