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Intensity and Distribution of Background X-rays in Wavelength-dispersive Spectrometry by Tomoya Arai is a Physics and Astronomy article available to read on EtoBox.

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Extensive studies of the components and distribution which govern background x-ray intensity in the short wavelength region of wavelengtb-dispersive spectrometry have been made. The theoretical calculations account for the contribution of coherent scattering (including anomalous dispersion factors), Compton scattering and absorption effects. For the precise comparison between the calculated and experimentally measured intensities, coherent and Compton scattered intensities of Rh Ku and Rh KB emitted from a rhodium-target x-ray tube were investigated with respect to different kinds of specimens. From the differences in the calculated and measured intensities, the intensity tailing of the large peak of the major components was found to be the Compton scattering of fluorescent x-rays. A theoretical expression for calculating the magnitude of the background x-ray intensity using an appropriately selected standard sample is described. The application of Co Ka x-rays interferred by Fe KB x-rays and the small intensity change in background x-rays for the trace element analysis of steel samples are discussed.

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Author

Tomoya Arai

Publisher

John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley (ISSN 0049-8246)

Published

1991

Language

EN

Field

Physics and Astronomy (Physical Sciences)