About this scholarly article

2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - A probabilistic physics-of-failure reliability assessment approach for integrated LED lamps by Sun, Bo; Fan, Jiajie; Fan, Xuejun; Zhang, Guoqi is a scholarly article available to read on EtoBox.

Author

Sun, Bo; Fan, Jiajie; Fan, Xuejun; Zhang, Guoqi

Publisher

IEEE

Published

2018

Language

EN