Skip to content

Opening book details…

About this scholarly article

2010 3rd International Congress on Image and Signal Processing - Single closed contour trademark classification based on support vector machine by Haitao, Ren; Yeli, Li; Likun, Lu is a scholarly article available to read on EtoBox.

Author
Haitao, Ren; Yeli, Li; Likun, Lu
Publisher
IEEE
Published
2010

More by Haitao, Ren; Yeli, Li; Likun, Lu

Browse all works by Haitao, Ren; Yeli, Li; Likun, Lu