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About this Engineering article
Young S Modulus Measurements of Silicon Nanostructures Using a Scanning Probe System: a Non-destructive Evaluation Approach by Virwani, Kumar R; Malshe, A P; Schmidt, W F; Sood, D K is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Virwani, Kumar R; Malshe, A P; Schmidt, W F; Sood, D K
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0964-1726)
- Published
- 2003
- Field
- Engineering (Physical Sciences)