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Toward a Streamlined Projection of Small Device Bias Temperature Instability Lifetime Distributions by Toledano-Luque, María ;Kaczer, Ben ;Grasser, Tibor ;Roussel, Philippe J. ;Franco, Jacopo ;Groeseneken, Guido is a Engineering article available to read on EtoBox.
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- Author
- Toledano-Luque, María ;Kaczer, Ben ;Grasser, Tibor ;Roussel, Philippe J. ;Franco, Jacopo ;Groeseneken, Guido
- Publisher
- AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics; AVS Science and Technology Society (ISSN 1520-8567)
- Published
- 2013
- Field
- Engineering (Physical Sciences)