About this scholarly article

SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Ultraviolet bidirectional reflectance distribution function measurement and analysis of typical roughness surface by Bai, Lu; Harding, Kevin; Huang, Peisen S.; Zhang, Han-lu; Cao, Yun-hua; Yoshizawa, Toru; Li, Hai-ying; Wu, Zhen-sen; Wang, Shi-mei is a scholarly article available to read on EtoBox.

Author

Bai, Lu; Harding, Kevin; Huang, Peisen S.; Zhang, Han-lu; Cao, Yun-hua; Yoshizawa, Toru; Li, Hai-ying; Wu, Zhen-sen; Wang, Shi-mei

Publisher

SPIE

Published

2010

Language

EN