About this scholarly article

SPIE Proceedings [SPIE Aerospace Sensing - Orlando, FL (Monday 20 April 1992)] Applications of Artificial Intelligence X: Machine Vision and Robotics - Rotation measurement techniques for alignment in PCB automated inspection by Rodriguez, Arturo A.; Wu, Frederick Y.; Mandeville, Jon R.; Bowyer, Kevin W. is a scholarly article available to read on EtoBox.

Author

Rodriguez, Arturo A.; Wu, Frederick Y.; Mandeville, Jon R.; Bowyer, Kevin W.

Publisher

SPIE

Published

1992

Language

EN