Skip to content

Opening book details…

About this Engineering article

Local atomic and electronic structure of oxide/GaAs and SiO2/Si interfaces using high-resolution XPS by F. J. Grunthaner is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
F. J. Grunthaner
Publisher
AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics (ISSN 0022-5355)
Published
1979
Field
Engineering (Physical Sciences)

More by F. J. Grunthaner

Browse all works by F. J. Grunthaner