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2010 Proceedings of ESSCIRC - 0.5V FinFET SRAM with dynamic threshold control of pass gates for salvaging malfunctioned bits by O'uchi, S.; Endo, K.; Liu, Y. X.; Nakagawa, T.; Matsukawa, T.; Ishikawa, Y.; Tsukada, J.; Yamauchi, H.; Sekigawa, T.; Koike, H.; Sakamoto, K.; Masahara, M. is a scholarly article available to read on EtoBox.

Author
O'uchi, S.; Endo, K.; Liu, Y. X.; Nakagawa, T.; Matsukawa, T.; Ishikawa, Y.; Tsukada, J.; Yamauchi, H.; Sekigawa, T.; Koike, H.; Sakamoto, K.; Masahara, M.
Publisher
IEEE
Published
2010
Language
EN

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