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About this Engineering article

Failure mechanism study of anisotropic conductive film (ACF) packages by Mercado, L.L.; White, J.; Sarihan, V.; Lee, T.T. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Mercado, L.L.; White, J.; Sarihan, V.; Lee, T.T.
Publisher
IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1521-3331)
Published
2003
Language
EN
Field
Engineering (Physical Sciences)

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