About this scholarly article

Electronic and Photonic Packaging, Electrical Systems Design and Photonics, and Nanotechnology - Characterization of Low-K Dielectrics Sol-Gel Coating by Spectroscopy Ellipsometry by Xie, H.; Wei, J. is a scholarly article available to read on EtoBox.

Author

Xie, H.; Wei, J.

Publisher

ASMEDC

Published

2005

Language

EN