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About this Materials Science article
Band alignment of atomic layer deposited MgO/Zn0.8Al0.2O heterointerface determined by charge corrected X-ray photoelectron spectroscopy by Yan, Baojun; Liu, Shulin; Yang, Yuzhen; Heng, Yuekun is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Yan, Baojun; Liu, Shulin; Yang, Yuzhen; Heng, Yuekun
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0169-4332)
- Published
- 2016
- Field
- Materials Science (Physical Sciences)
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