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About this Materials Science article
Study of bulk and interface defects in silicon oxide with X-ray absorption spectroscopy by Massimo Tallarida; Dieter Schmeisser is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Massimo Tallarida; Dieter Schmeisser
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd; Elsevier BV (ISSN 0921-5107)
- Published
- 2007
- Language
- EN
- Field
- Materials Science (Physical Sciences)