About this scholarly article

2018 IEEE 13th Dallas Circuits and Systems Conference (DCAS) - Test Frequency Compaction for Fault Detection in Analog Circuits Using Sensitivity Analysis by Adha, Ajaykumar; Nourani, Mehrdad is a scholarly article available to read on EtoBox.

Author

Adha, Ajaykumar; Nourani, Mehrdad

Publisher

IEEE

Published

2018