Opening book details…
About this Engineering article
Correlation of contact resistance with metal diffusion for oxidized Au/Ni/p-GaN contacts studied using Rutherford backscattering spectroscopy by Hu, C Y; Ding, Z B; Qin, Z X; Chen, Z Z; Yang, Z J; Yu, T J; Hu, X D; Yao, S D; Zhang, G Y is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Hu, C Y; Ding, Z B; Qin, Z X; Chen, Z Z; Yang, Z J; Yu, T J; Hu, X D; Yao, S D; Zhang, G Y
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0268-1242)
- Published
- 2006
- Language
- EN
- Field
- Engineering (Physical Sciences)