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About this Engineering article
Characterization of the ZnSe/GaAs Interface Layer by Tem and Spectroscopic Ellipsometry by Dahmani, R.; Salamanca-Riba, L.; Beesabathina, D. P.; Nguyen, N. V.; Chandler-Horowitz, D.; Jonker, B. T. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Dahmani, R.; Salamanca-Riba, L.; Beesabathina, D. P.; Nguyen, N. V.; Chandler-Horowitz, D.; Jonker, B. T.
- Publisher
- Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP) (ISSN 0272-9172)
- Published
- 1992
- Language
- EN
- Field
- Engineering (Physical Sciences)