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Characteristics of Different Types of Filaments in Resistive Switching Memories Investigated by Complex Impedance Spectroscopy by Jiang, X. L.; Zhao, Y. G.; Chen, Y. S.; Li, D.; Luo, Y. X.; Zhao, D. Y.; Sun, Z.; Sun, J. R.; Zhao, H. W. is a Engineering article available to read on EtoBox.
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- Author
- Jiang, X. L.; Zhao, Y. G.; Chen, Y. S.; Li, D.; Luo, Y. X.; Zhao, D. Y.; Sun, Z.; Sun, J. R.; Zhao, H. W.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2013
- Language
- EN
- Field
- Engineering (Physical Sciences)