About this scholarly article

AIP Conference Proceedings [AIP Publishing LLC INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS 2013: Proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013 - Bologna, Italy (21–26 July 2013)] - Characterization of few-layered graphene grown by carbon implantation by Lee, Kin Kiong; McCallum, Jeffrey C.; Jamieson, David N. is a scholarly article available to read on EtoBox.

Author

Lee, Kin Kiong; McCallum, Jeffrey C.; Jamieson, David N.

Publisher

AIP Publishing LLC

Published

2014

Language

EN