About this scholarly article

SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Optical Design and Testing II - Ultrahighly accurate 3D profilometer by Tsutsumi, Hideki; Yoshizumi, Keiichi; Takeuchi, Hiroyuki; Wang, Yongtian; Weng, Zhicheng; Ye, Shenghua; Sasian, Jose M. is a scholarly article available to read on EtoBox.

Author

Tsutsumi, Hideki; Yoshizumi, Keiichi; Takeuchi, Hiroyuki; Wang, Yongtian; Weng, Zhicheng; Ye, Shenghua; Sasian, Jose M.

Publisher

SPIE

Published

2005

Language

EN