About this scholarly article

2008 International Conference on Electrical and Computer Engineering - Direct extraction of interface trap states from the low frequency gate C-V characteristics of MOS devices with ultrathin high-К gate dielectrics by Satter, Md. M.; Haque, A. is a scholarly article available to read on EtoBox.

Author

Satter, Md. M.; Haque, A.

Publisher

IEEE

Published

2008