About this scholarly article

SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - 3D optical measuring technologies and systems for scientific and industrial applications by Chugui, Yuri V.; Verkhogliad, Alexander G.; Stupak, Michael F.; Angelsky, Oleg V. is a scholarly article available to read on EtoBox.

Author

Chugui, Yuri V.; Verkhogliad, Alexander G.; Stupak, Michael F.; Angelsky, Oleg V.

Publisher

SPIE

Published

2006

Language

EN