About this Materials Science article
Characterisation of Thin Film Superconducting Multilayers and Their Interfaces Using Secondary Ion Mass Spectrometry by N.J. Montgomery; J.L. MacManus-Driscoll; D.S. McPhail; B. Moeckly; K. Char is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- N.J. Montgomery; J.L. MacManus-Driscoll; D.S. McPhail; B. Moeckly; K. Char
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0925-8388)
- Published
- 1997
- Language
- EN
- Field
- Materials Science (Physical Sciences)