Opening book details…
About this Engineering article
S-band pulsed-RF operating life test on AlGaN/GaN HEMT devices for radar application by Moultif, N.; Latry, O.; Ndiaye, M.; Neveu, T.; Joubert, E.; Moreau, C.; Goupy, J-F. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Moultif, N.; Latry, O.; Ndiaye, M.; Neveu, T.; Joubert, E.; Moreau, C.; Goupy, J-F.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 2019
- Language
- EN
- Field
- Engineering (Physical Sciences)