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About this Engineering article
Defect tolerance in VLSI circuits: techniques and yield analysis by Koren, I.; Koren, Z. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Koren, I.; Koren, Z.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9219)
- Published
- 1998
- Field
- Engineering (Physical Sciences)