About this scholarly article

SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California (Sunday 1 August 2010)] Instrumentation, Metrology, and Standards for Nanomanufacturing IV - Magnetic measurement of pulsed laser-induced nanomagnetic arrays using Surface Magneto-Optic Kerr Effect by Shirato, N.; Krishna, H.; Gangopadhyay, A. K.; Kalyanaraman, R.; Postek, Michael T. is a scholarly article available to read on EtoBox.

Author

Shirato, N.; Krishna, H.; Gangopadhyay, A. K.; Kalyanaraman, R.; Postek, Michael T.

Publisher

SPIE

Published

2010

Language

EN