About this Engineering article
A Critical Review on Multiscale Material Database Requirement for Accurate Three-Dimensional IC Simulation Input by Kong-Boon Yeap; Roellig, M.; Huebner, R.; Gall, M.; Sukharev, V.; Zschech, E. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kong-Boon Yeap; Roellig, M.; Huebner, R.; Gall, M.; Sukharev, V.; Zschech, E.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1530-4388)
- Published
- 2012
- Field
- Engineering (Physical Sciences)