About this scholarly article

2012 IEEE Conference on Prognostics and Health Management - SVM with optimized parameters and its application to electronic system fault diagnosis by Guo, Yangming; Ma, Jiezhong; Xiao, Fan; Tian, Tao is a scholarly article available to read on EtoBox.

Author

Guo, Yangming; Ma, Jiezhong; Xiao, Fan; Tian, Tao

Publisher

IEEE

Published

2012

Language

EN