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About this Engineering article
Modeling Application-Level Soft Error Effects for Single-Event Multi-Bit Upsets by Cho, Hyungmin; Kwon, Kon-Woo is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Cho, Hyungmin; Kwon, Kon-Woo
- Publisher
- Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers Inc.; Institute of Electrical and Electronics Engineers (IEEE); Research Square (ISSN 2169-3536)
- Published
- 2019
- Field
- Engineering (Physical Sciences)