About this Engineering article
A Review of Hot Carrier Degradation in n-Channel MOSFETs--Part I: Physical Mechanism by Mahapatra, Souvik; Sharma, Uma is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Mahapatra, Souvik; Sharma, Uma
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2020
- Field
- Engineering (Physical Sciences)