Opening book details…
About this Engineering article
Thermal and Electrical Conduction in Ultrathin Metallic Films: 7 nm down to Sub‐Nanometer Thickness by Lin, Huan; Xu, Shen; Wang, Xinwei; Mei, Ning is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Lin, Huan; Xu, Shen; Wang, Xinwei; Mei, Ning
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); Wiley - V C H Verlag GmbbH & Co.; Publons; Wiley (ISSN 1613-6810)
- Published
- 2013
- Field
- Engineering (Physical Sciences)
More by Lin, Huan; Xu, Shen; Wang, Xinwei; Mei, Ning
Browse all works by Lin, Huan; Xu, Shen; Wang, Xinwei; Mei, Ning