About this scholarly article

2006 International Symposium on VLSI Technology, Systems, and Applications - Detection of Trap Generation in High-κ Gate Stacks due to Constant Voltage Stress by Young, C.D.; Heh, D.; Choi, R.; Peterson, J.J.; Barnett, J.; Lee, B.H.; Zeitzoff, P.; Brown, G.A.; Bersuker, G. is a scholarly article available to read on EtoBox.

Author

Young, C.D.; Heh, D.; Choi, R.; Peterson, J.J.; Barnett, J.; Lee, B.H.; Zeitzoff, P.; Brown, G.A.; Bersuker, G.

Publisher

IEEE

Published

2006

Language

EN