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About this Engineering article
Enhanced reliability and capacitance stability of ZrO 2 -based decoupling capacitors by interface doping with Al 2 O 3 by Mart, C.; Zybell, S.; Riedel, S.; Czernohorsky, M.; Seidel, K.; Weinreich, W. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Mart, C.; Zybell, S.; Riedel, S.; Czernohorsky, M.; Seidel, K.; Weinreich, W.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0167-9317)
- Published
- 2017
- Language
- EN
- Field
- Engineering (Physical Sciences)
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