About this scholarly article

2016 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) - Electrothermal characterization of SOI FinFETs by Peng Zhang, ; Wenchao Chen, ; Jun Hu, ; Yin, Wen-Yan is a scholarly article available to read on EtoBox.

Author

Peng Zhang, ; Wenchao Chen, ; Jun Hu, ; Yin, Wen-Yan

Publisher

IEEE

Published

2016

Language

EN