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About this Engineering article
A Reliable Metric for Mobility Extraction of Short-Channel MOSFETs by Severi, S.; Pantisano, L.; Augendre, E.; San Andres, E.; Eyben, P.; De Meyer, K. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Severi, S.; Pantisano, L.; Augendre, E.; San Andres, E.; Eyben, P.; De Meyer, K.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2007
- Field
- Engineering (Physical Sciences)
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