Opening book details…
About this Engineering article
Optical Image Processing - a Useful Tool in Wafer Inspection by G. Nitzsche; R. Hild; U. Altenburger; H. Other is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- G. Nitzsche; R. Hild; U. Altenburger; H. Other
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0167-9317)
- Published
- 1994
- Language
- EN
- Field
- Engineering (Physical Sciences)
More by G. Nitzsche; R. Hild; U. Altenburger; H. Other
Browse all works by G. Nitzsche; R. Hild; U. Altenburger; H. Other