Opening book details…
About this Engineering article
Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics—Part I: Experimental by Ullmann, Bianka; Jech, Markus; Puschkarsky, Katja; Rott, Gunnar Andreas; Waltl, Michael; Illarionov, Yury; Reisinger, Hans; Grasser, Tibor is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Ullmann, Bianka; Jech, Markus; Puschkarsky, Katja; Rott, Gunnar Andreas; Waltl, Michael; Illarionov, Yury; Reisinger, Hans; Grasser, Tibor
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2019
- Field
- Engineering (Physical Sciences)