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About this Engineering article
Defect Engineering by Surface Chemical State in Boron-doped Preamorphized Silicon by S. H. Yeong; M. P. Srinivasan; B. Colombeau; L. Chan; R. Akkipeddi; C. T. M. Kwok; R. Vaidyanathan; E. G. Seebauer is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- S. H. Yeong; M. P. Srinivasan; B. Colombeau; L. Chan; R. Akkipeddi; C. T. M. Kwok; R. Vaidyanathan; E. G. Seebauer
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2007
- Language
- EN
- Field
- Engineering (Physical Sciences)