About this scholarly article

SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Some possibilities of the use of confluence analysis for an interval parameter estimation of semiconductors in a cathodoluminescent microscopy by Gagarin, Yu. E.; Stepovich, M. A.; Filachev, Anatoly M. is a scholarly article available to read on EtoBox.

Author

Gagarin, Yu. E.; Stepovich, M. A.; Filachev, Anatoly M.

Publisher

SPIE

Published

2004