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About this Physics and Astronomy article
Photoreflectance determination of the wetting layer thickness in the InxGa1−xAs∕GaAs quantum dot system for a broad indium content range of 0.3–1 by Sęk, G.; Poloczek, P.; Ryczko, K.; Misiewicz, J.; Löffler, A.; Reithmaier, J. P.; Forchel, A. is a Physics and Astronomy article available to read on EtoBox.
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- Author
- Sęk, G.; Poloczek, P.; Ryczko, K.; Misiewicz, J.; Löffler, A.; Reithmaier, J. P.; Forchel, A.
- Publisher
- American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
- Published
- 2006
- Field
- Physics and Astronomy (Physical Sciences)